![Ein Wechselrichter nach einer Generalüberholung](https://static.wixstatic.com/media/75cf67_935ad01ec31242329292440b4c514bef~mv2.webp/v1/fill/w_740,h_555,al_c,q_85,enc_auto/75cf67_935ad01ec31242329292440b4c514bef~mv2.webp)
Most damage to the power electronics of photovoltaic inverters is caused by component failure. Such failure is usually related to ageing of the components.
Figure 1 shows the distribution of components causing failure. Semiconductors and capacitors are responsible for half of the damage in power electronic systems [1].
![Ausfallverteilung in der Leistungselektronik](https://static.wixstatic.com/media/75cf67_9d0a321a72614e55ae8bfa37f566cbb2~mv2.webp/v1/fill/w_740,h_500,al_c,q_85,enc_auto/75cf67_9d0a321a72614e55ae8bfa37f566cbb2~mv2.webp)
Figure 1: Failure distribution in power electronics
In general, the failure patterns and levels in electronics are very diverse. At the two ends of such a spectrum of faults are 'open circuit' (OC) faults, a type of high impedance state, and 'short circuit' (SC) faults. In our blog series, you can read about the variety of errors between these two ends of the spectrum.
![Fehlerspektrum in der Elektronik: zwischen „Open Circuit“ (OC) und „Short Circuit“ (SC).](https://static.wixstatic.com/media/75cf67_6448ffdcbed94732bdd85353f2183677~mv2.webp/v1/fill/w_740,h_110,al_c,q_80,enc_auto/75cf67_6448ffdcbed94732bdd85353f2183677~mv2.webp)
Our series on the topic of component weakening
In the following weeks we’ll discuss the individual components and their degradation effects with regard to their reliability under certain environmental conditions:
Power semiconductors (2/5)
Capacitors (3/5)
Optoelectronic elements (4/5)
Electromechanical switching devices (5/5)
[1] E. Wolfgang (2007): Examples for Failures in Power Electronics Systems, presented at ECPE Tutorial „Reliability of Power Electronic Systems“ in Nuremberg.